ALTERA SF
Built to thrive in tough conditions, ALTERA SF withstands temperature shifts, vibrations, dust, grime, and the daily demands of a production setting. By eliminating the delays of off-floor inspection, ALTERA SF empowers production teams to detect issues early, improve process control, and keep manufacturing running smoothly without compromising throughput. Request a Quote Shopfloor Technology ALTERA […]
ALTERA SL
The ALTERA SL Series from LK Metrology represents the pinnacle of high-accuracy coordinate measuring machine (CMM) technology available today. With its High Accuracy and Very High Accuracy versions, the ALTERA SL Series stands at the forefront of the market, offering levels of precision that compete with and challenge the sector’s leading solutions. Request a Quote […]
ALTERA Scantek5
The ALTERA SCANtek5 Series from LK Metrology redefines the landscape of 5-axis multisensor coordinate measuring machines (CMMs) with its unparalleled accuracy and flexibility. This series stands as the most comprehensive solution in the very high accuracy 5-axis multisensor CMM category, designed to meet the dynamic needs of today’s manufacturing landscape, especially in the automotive and […]
ALTERA M
The ALTERA M Series by LK Metrology sets a new benchmark in the realm of very high accuracy, multipurpose coordinate measuring machines (CMMs). It represents the pinnacle of available CMM classes today, combining advanced capabilities with unparalleled flexibility. Equipped with cutting-edge multi-sensor ready technology, the ALTERA M Series adapts to evolving customer needs, allowing for […]
ALTERA S
The ALTERA S Series by LK Metrology represents the zenith of small, multipurpose coordinate measuring machines (CMMs), offering unparalleled capabilities within the small compact class. Designed with the future in mind, this series is equipped with advanced multi-sensor ready technology, allowing for seamless adaptation to changing customer needs and applications without the need for additional […]
ALTERA C HA
The ALTERA C HA Series represents a significant leap in the precision capabilities of the already impressive ALTERA C range from LK Metrology. Designed for applications where accuracy is non-negotiable, the HA (High Accuracy) version boasts substantial improvements in volumetric accuracy, repeatability, and tactile scanning performance. Request a Quote Elevated accuracy for demanding applications The […]
ALTERA C
The LK Metrology ALTERA C Series stands as the epitome of innovation in the compact, entry-level coordinate measuring machine (CMM) category. Designed to meet the diverse and demanding needs of quality laboratories and shopfloor environments, the ALTERA C leverages advanced metrology software, multi-sensor technology, and a ceramic-bridge design to deliver unparalleled accuracy and efficient throughput. […]
ALTO
The LK Metrology ALTO Series emerges as a tailored solution for the evolving challenges of dimensional quality control, where the demand for measuring smaller parts, navigating more complex designs, and adhering to tighter design limits is ever-increasing. ALTO is the go-to CMM for quality professionals embarking on the journey towards automated inspection, offering user-friendly software […]
MAXIMA R
Designed for the measurement of the heaviest workpieces manufactured to precise tolerances, MAXIMA R is ideal for applications where consistent measurement integrity is essential – from aerospace and power generation to transportation and industrial machinery. With its innovative twin-rail design, MAXIMA R enables safe, streamlined loading of heavy workpieces, including integration with automated floor-level transfer […]
MAXIMA
With measuring volumes from 12m³ to 72m³, the MAXIMA range offers the largest measurement capacity of any table bridge-type CMM available today. Its high-capacity granite table provides outstanding stability, supporting even the heaviest components without compromising performance. Developed to meet the growing demand for precise measurement of oversized and complex components, MAXIMA is ideally suited […]
